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Journal description
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Details for article 83 of 102 found articles
| Title: |
Thermal Conductivity Measurement of Thermoelectric Thin Films by a Versatility-Enhanced 2ω Method |
| Author: |
Okuhata, Ryo Watanabe, Kentaro Ikeuchi, Satoaki Ishida, Akihiro Nakamura, Yoshiaki |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 46 (2016) nr. 5 pages 3089-3096 |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 83 of 102 found articles
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