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Journal description
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Details for article 9 of 80 found articles
| Title: |
Correlation of Etch Pits and Dislocations in As-grown and Thermal Cycle-Annealed HgCdTe(211) Films |
| Author: |
Vaghayenegar, M. Jacobs, R. N. Benson, J. D. Stoltz, A. J. Almeida, L. A. Smith, David J. |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 46 (2017) nr. 8 pages 5007-5019 |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 80 found articles
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