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Details for article 2 of 70 found articles
| Title: |
A Comparison of Defects Between InAs Single Crystals Grown by LEC and VGF Methods |
| Author: |
Shen, Guiying Zhao, Youwen Sun, Jing Liu, Jingming Dong, Zhiyuan Xie, Hui Wang, Fenghua Yang, Jun |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 49 () nr. 9 pages 5104-5109 |
| Year: |
2020-03-28 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 70 found articles
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