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Journal description
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Details for article 39 of 70 found articles
| Title: |
Microstructure of Stacking Fault Complex/Carrot Defects at Interface Between 4H-SiC Epitaxial Layers and Substrates |
| Author: |
Sako, Hideki Kobayashi, Kenji Ohira, Kentaro Isshiki, Toshiyuki |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 49 () nr. 9 pages 5213-5218 |
| Year: |
2020-05-13 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 39 of 70 found articles
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