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Journal description
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Details for article 8 of 70 found articles
| Title: |
Charging Effects in Al-SiO2-p-Si Structures After Low-Energy Electron Beam Irradiation |
| Author: |
Vergeles, P. S. Kulanchikov, Yu. O. Yakimov, E. B. |
| Appeared in: |
Journal of electronic materials |
| Paging: | Volume 49 () nr. 9 pages 5178-5183 |
| Year: |
2020-03-28 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 70 found articles
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