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                             14 results found
no title author magazine year volume issue page(s) type
1 A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients Zhang, Zhichao
2013
29 2 p. 249-253
article
2 CEP: Correlated Error Propagation for Hierarchical Soft Error Analysis Chen, Liang
2013
29 2 p. 143-158
article
3 Circuit Level Concurrent Error Detection in FSMs Kehl, Natalja
2013
29 2 p. 185-192
article
4 Detailed Analysis of Compilation Options for Robust Software-based Embedded Systems Bergaoui, S.
2013
29 2 p. 211-222
article
5 Editorial Agrawal, Vishwani D.
2013
29 2 p. 121
article
6 Guest Editorial Gizopoulos, Dimitris
2013
29 2 p. 125-126
article
7 Manipulation of Training Sets for Improving Data Mining Coverage-Driven Verification Romero, Edgar Leonardo
2013
29 2 p. 223-236
article
8 Novel Self-Timed, Pipelined Clock Scan Architecture Chakraborty, Kanad
2013
29 2 p. 241-247
article
9 On the Simulation of HCI-Induced Variations of IC Timings at High Level Heron, Olivier
2013
29 2 p. 127-141
article
10 Reliability-Aware Heterogeneous 3D Chip Multiprocessor Design Akturk, Ismail
2013
29 2 p. 177-184
article
11 Secure JTAG Implementation Using Schnorr Protocol Das, Amitabh
2013
29 2 p. 193-209
article
12 Self-Adaptive Fault Tolerance in Multi-/Many-Core Systems Bolchini, Cristiana
2013
29 2 p. 159-175
article
13 Soft Fault Classification of Analog Circuits Using Network Parameters and Neural Networks Kavithamani, A.
2013
29 2 p. 237-240
article
14 Test Technology Newsletter 2013
29 2 p. 123-124
article
                             14 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands