| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Fault Tolerant Approach for FPGA Embedded Processors Based on Runtime Partial Reconfiguration
|
Vavousis, Alexandros
|
|
2013
|
29 |
6 |
p. 805-823
|
artikel
|
| 2 |
Autonomous Fault-Tolerant Systems onto SRAM-based FPGA Platforms
|
Bolchini, Cristiana
|
|
2013
|
29 |
6 |
p. 779-793
|
artikel
|
| 3 |
Editorial
|
Agrawal, Vishwani D.
|
|
2013
|
29 |
6 |
p. 741-742
|
artikel
|
| 4 |
Effective Timing Error Tolerance in Flip-Flop Based Core Designs
|
Valadimas, Stefanos
|
|
2013
|
29 |
6 |
p. 795-804
|
artikel
|
| 5 |
Efficient Test Compression Technique for SoC Based on Block Merging and Eight Coding
|
Wu, Tie-Bin
|
|
2013
|
29 |
6 |
p. 849-859
|
artikel
|
| 6 |
Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM Technique
|
Xia, Tian
|
|
2013
|
29 |
6 |
p. 893-901
|
artikel
|
| 7 |
MoDiVHA: A Hierarchical Strategy for Distributed Test Assignment
|
Koppe, Jefferson P.
|
|
2013
|
29 |
6 |
p. 839-847
|
artikel
|
| 8 |
Multi-bit Sigma-Delta TDC Architecture with Improved Linearity
|
Uemori, Satoshi
|
|
2013
|
29 |
6 |
p. 879-892
|
artikel
|
| 9 |
Online Testable Approaches in Reversible Logic
|
Nayeem, N. M.
|
|
2013
|
29 |
6 |
p. 763-778
|
artikel
|
| 10 |
Physics-Based Low-Cost Test Technique for High Voltage LDMOS
|
Kannan, Sukeshwar
|
|
2013
|
29 |
6 |
p. 745-762
|
artikel
|
| 11 |
Preserving Hamming Distance in Arithmetic and Logical Operations
|
Dolev, Shlomi
|
|
2013
|
29 |
6 |
p. 903-907
|
artikel
|
| 12 |
Selective SWIFT-R
|
Restrepo-Calle, Felipe
|
|
2013
|
29 |
6 |
p. 825-838
|
artikel
|
| 13 |
Survey and Evaluation of Automated Model Generation Techniques for High Level Modeling and High Level Fault Modeling
|
Xia, Likun
|
|
2013
|
29 |
6 |
p. 861-877
|
artikel
|
| 14 |
Test Technology Newsletter
|
|
|
2013
|
29 |
6 |
p. 743-744
|
artikel
|
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