| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Bridged Contactless Measurement Technique for LC Tank Based Voltage-Controlled Oscillator
|
Liu, Zhe
|
|
2017
|
33 |
2 |
p. 261-266
|
artikel
|
| 2 |
A Parallel Test Application Method towards Power Reduction
|
Deng, Ding
|
|
2017
|
33 |
2 |
p. 157-169
|
artikel
|
| 3 |
A Systematic Method for Arranging Diagnostic Tests in Linear Analog DC and AC Circuits
|
Tadeusiewicz, Michał
|
|
2017
|
33 |
2 |
p. 147-156
|
artikel
|
| 4 |
A Time-Optimized Scheme Towards Analysis of Channel-Shorts in on-Chip Networks
|
Bhowmik, Biswajit
|
|
2017
|
33 |
2 |
p. 227-254
|
artikel
|
| 5 |
Editorial
|
Agrawal, Vishwani D.
|
|
2017
|
33 |
2 |
p. 141
|
artikel
|
| 6 |
Link Testing: a Survey of Current Trends in Network on Chip
|
Aghaei, Babak
|
|
2017
|
33 |
2 |
p. 209-225
|
artikel
|
| 7 |
Power-Aware Optimization of SoC Test Schedules Using Voltage and Frequency Scaling
|
Sheshadri, Vijay
|
|
2017
|
33 |
2 |
p. 171-187
|
artikel
|
| 8 |
Reliability Model for Multiple-Error Protected Static Memories
|
Jahanirad, Hadi
|
|
2017
|
33 |
2 |
p. 189-207
|
artikel
|
| 9 |
Test Technology Newsletter
|
|
|
2017
|
33 |
2 |
p. 143-145
|
artikel
|
| 10 |
Total Ionizing Dose Effect and Single Event Burnout of VDMOS with Different Inter Layer Dielectric and Passivation
|
Mo, Jiongjiong
|
|
2017
|
33 |
2 |
p. 255-259
|
artikel
|
| 11 |
VI-Based Measurement System Focusing on Space Applications
|
Seixas, L. E.
|
|
2017
|
33 |
2 |
p. 267-274
|
artikel
|
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