| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Analysing NBTI Impact on SRAMs with Resistive Defects
|
Martins, M. T.
|
|
2017
|
33 |
5 |
p. 637-655
|
artikel
|
| 2 |
A Novel Noise-assisted Prognostic Method for Linear Analog Circuits
|
Yan, Liyue
|
|
2017
|
33 |
5 |
p. 559-572
|
artikel
|
| 3 |
Editorial
|
Agrawal, Vishwani D.
|
|
2017
|
33 |
5 |
p. 539-540
|
artikel
|
| 4 |
Efficient Techniques for Fault Detection and Correction of Reversible Circuits
|
Babu, Hafiz Md. Hasan
|
|
2017
|
33 |
5 |
p. 591-605
|
artikel
|
| 5 |
Formal Methods Based Synthesis of Single Event Transient Tolerant Combinational Circuits
|
Hamad, Ghaith Bany
|
|
2017
|
33 |
5 |
p. 607-620
|
artikel
|
| 6 |
High Speed Error Tolerant Adder for Multimedia Applications
|
Geetha, S.
|
|
2017
|
33 |
5 |
p. 675-688
|
artikel
|
| 7 |
New Light Weight Threshold Voltage Defined Camouflaged Gates for Trustworthy Designs
|
Rathor, Vijaypal Singh
|
|
2017
|
33 |
5 |
p. 657-668
|
artikel
|
| 8 |
Novel Method for Nondestructive Body Effect Measurement in Dynamic Random Access Memory
|
Jung, Ilwoo
|
|
2017
|
33 |
5 |
p. 669-674
|
artikel
|
| 9 |
Offline Error Detection in MEDA-Based Digital Microfluidic Biochips Using Oscillation-Based Testing Methodology
|
Shukla, Vineeta
|
|
2017
|
33 |
5 |
p. 621-635
|
artikel
|
| 10 |
Soft Fault Diagnosis in Analog Circuits Based on Bispectral Models
|
Deng, Yong
|
|
2017
|
33 |
5 |
p. 543-557
|
artikel
|
| 11 |
Test Technology Newsletter
|
|
|
2017
|
33 |
5 |
p. 541-542
|
artikel
|
| 12 |
Three-Stage Optimization of Pre-Bond Diagnosis of TSV Defects
|
Zhang, Bei
|
|
2017
|
33 |
5 |
p. 573-589
|
artikel
|
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