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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
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Details for article 7 of 11 found articles
| Title: |
Power-Aware Optimization of SoC Test Schedules Using Voltage and Frequency Scaling |
| Author: |
Sheshadri, Vijay Agrawal, Vishwani D. Agrawal, Prathima |
| Appeared in: |
Journal of electronic testing |
| Paging: | Volume 33 (2017) nr. 2 pages 171-187 |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 11 found articles
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